Title : 
A structural approach to state space decomposition for approximate reachability analysis
         
        
            Author : 
Cho, Hyunwoo ; Hachtel, Gary D. ; Macii, Enrico ; Poncino, Massimo ; Somenzi, Fabio
         
        
            Author_Institution : 
Motorola Inc., Austin, TX, USA
         
        
        
        
        
        
            Abstract : 
Exploiting circuit structure is a key issue in the implementation of algorithms for state space decomposition when the target is approximate FSM traversal. Given the gate-level description of a sequential circuit, the information about its structure can be captured by evaluating the affinity between pairs or groups of latches. Two main factors have to be considered in carrying out the structural analysis of a sequential circuit: latch connectivity and latch correlation. We estimate the affinity of two latches by combining these two factors, and we use this measure to translate the state space decomposition problem into a graph partitioning problem. Traversal results obtained on the largest ISCAS´89 benchmarks show the effectiveness of the method
         
        
            Keywords : 
directed graphs; finite automata; finite state machines; flip-flops; graph theory; performance evaluation; sequential circuits; FSM traversal; approximate reachability analysis; benchmarks; circuit structure; directed graph; finite state machines; gate-level description; graph partitioning problem; latch connectivity; latch correlation; sequential circuit; state space decomposition; state space decomposition problem; structural approach; Circuit analysis computing; Clustering algorithms; Latches; Logic; Optical computing; Partitioning algorithms; Reachability analysis; Sequential circuits; State estimation; State-space methods;
         
        
        
        
            Conference_Titel : 
Computer Design: VLSI in Computers and Processors, 1994. ICCD '94. Proceedings., IEEE International Conference on
         
        
            Conference_Location : 
Cambridge, MA
         
        
            Print_ISBN : 
0-8186-6565-3
         
        
        
            DOI : 
10.1109/ICCD.1994.331896