Title :
A Software Testing Method for Microcontrollers
Author :
Matsui, Nobuo ; Nukushina, Harunobu
Author_Institution :
Fourth Development Engineering Department, Toshiba Corporation, Japan
Conference_Titel :
Consumer Electronics, 1990. ICCE 90. IEEE 1990 International Conference on
DOI :
10.1109/ICCE.1990.665884
