A Software Testing Method for Microcontrollers

Author

Matsui, Nobuo ; Nukushina, Harunobu

Author_Institution

Fourth Development Engineering Department, Toshiba Corporation, Japan

fYear

1990

fDate

6-8 Jun 1990

Firstpage

110

Lastpage

111

fLanguage

English

Publisher

ieee

Conference_Titel

Consumer Electronics, 1990. ICCE 90. IEEE 1990 International Conference on

Type

DOI

10.1109/ICCE.1990.665884

Filename

665884

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