• DocumentCode
    2161087
  • Title

    Novel optical and thermal modeling for modelocked VCSELs

  • Author

    Bahl, Mayank ; Panoiu, Nicolae C. ; Osgood, Richard M., Jr.

  • Author_Institution
    Microelectron. Sci. Labs., Columbia Univ., New York, NY, USA
  • fYear
    2004
  • fDate
    19-20 Oct. 2004
  • Firstpage
    17
  • Lastpage
    22
  • Abstract
    We develop a new approach based on the finite-difference time-domain (FDTD) method for simulating dynamics of modelocked VCSELs. Our FDTD model, transcends the limitation of a widely used traveling-wave technique, and can be used to determine both the sub-wavelength spatial features of the optical field, as well as its temporal dynamics on a sub-cycle time-scale. The thermal effects are included through coupled lattice and plasma temperature equations. The material response is incorporated via the effective Bloch equations. A VCSEL with gain and saturable absorber is simulated and stable modelocking obtained. Fine features of the pulses spatial profile are also studied.
  • Keywords
    finite difference time-domain analysis; high-speed optical techniques; laser cavity resonators; laser mode locking; laser stability; laser theory; optical saturable absorption; semiconductor device models; semiconductor lasers; surface emitting lasers; thermo-optical effects; coupled lattice equations; effective Bloch equations; finite-difference time-domain method; laser dynamics; laser gain; modelocked VCSEL; optical field temporal dynamics; optical modeling; plasma temperature equations; pulse spatial profile; saturable absorber; stable modelocking; subwavelength spatial features; thermal effects; thermal modeling; traveling-wave technique; Equations; Finite difference methods; Laser modes; Optical devices; Optical materials; Plasma temperature; Surface emitting lasers; Time domain analysis; Ultrafast optics; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lightwave Technologies in Instrumentation and Measurement Conference, 2004. Proceedings of the
  • Print_ISBN
    0-7803-8722-8
  • Type

    conf

  • DOI
    10.1109/LTIMC.2004.1370982
  • Filename
    1370982