Testing Large Analog/Digital Signal Processing Chips

Author

Freeman, Smith

Author_Institution

David Sarnoff Research Center, Inc., Princeton, N.J.

fYear

1990

fDate

6-8 Jun 1990

Firstpage

116

Lastpage

117

fLanguage

English

Publisher

ieee

Conference_Titel

Consumer Electronics, 1990. ICCE 90. IEEE 1990 International Conference on

Type

DOI

10.1109/ICCE.1990.665887

Filename

665887

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