DocumentCode
2161201
Title
WRAPTure: a tool for evaluation and optimization of weights for weighted random pattern testing
Author
Majumdar, Amitava
Author_Institution
CrossCheck Technol. Inc., San Jose, CA, USA
fYear
1994
fDate
10-12 Oct 1994
Firstpage
288
Lastpage
290
Abstract
Two problems in weighted random pattern testing are addressed: 1) finding the expected test length to sample all patterns in a given test set for a given weight set; and 2) finding the optimal weight set for minimizing expected test length for a given test set. Exact analytical expressions for expected test length for sampling all patterns from a test set are given. Expressions for approximating this quantity are also derived. Based on these results an algorithm is formulated to obtain the optimal weight assignment. Experiments carried out on test sets for several circuits (including ISCAS ´85 benchmarks) yield of the order of 95% to 100% reduction in expected test length over that achieved by current techniques
Keywords
automatic testing; logic testing; optimisation; random processes; WRAPTure; expected test length; fanout free NAND circuits; optimal weight assignment; optimal weight set; weighted random pattern testing; Automatic test pattern generation; Benchmark testing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Hamming distance; High definition video; Sampling methods; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 1994. ICCD '94. Proceedings., IEEE International Conference on
Conference_Location
Cambridge, MA
Print_ISBN
0-8186-6565-3
Type
conf
DOI
10.1109/ICCD.1994.331907
Filename
331907
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