• DocumentCode
    2161201
  • Title

    WRAPTure: a tool for evaluation and optimization of weights for weighted random pattern testing

  • Author

    Majumdar, Amitava

  • Author_Institution
    CrossCheck Technol. Inc., San Jose, CA, USA
  • fYear
    1994
  • fDate
    10-12 Oct 1994
  • Firstpage
    288
  • Lastpage
    290
  • Abstract
    Two problems in weighted random pattern testing are addressed: 1) finding the expected test length to sample all patterns in a given test set for a given weight set; and 2) finding the optimal weight set for minimizing expected test length for a given test set. Exact analytical expressions for expected test length for sampling all patterns from a test set are given. Expressions for approximating this quantity are also derived. Based on these results an algorithm is formulated to obtain the optimal weight assignment. Experiments carried out on test sets for several circuits (including ISCAS ´85 benchmarks) yield of the order of 95% to 100% reduction in expected test length over that achieved by current techniques
  • Keywords
    automatic testing; logic testing; optimisation; random processes; WRAPTure; expected test length; fanout free NAND circuits; optimal weight assignment; optimal weight set; weighted random pattern testing; Automatic test pattern generation; Benchmark testing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Hamming distance; High definition video; Sampling methods; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1994. ICCD '94. Proceedings., IEEE International Conference on
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    0-8186-6565-3
  • Type

    conf

  • DOI
    10.1109/ICCD.1994.331907
  • Filename
    331907