Title :
Combining switch and site yields for soft-configurable WSI
Author_Institution :
Sun Microsystems, Inc., Mountain View, CA, USA
Abstract :
The configuration requirements of a soft-configurable pipelined memory are described. Monte Carlo simulations show that wafer yield dependence on high switch yields can be reduced substantially using switch path bypasses and/or spare columns. These simulations combine the effects of switch and site failures in ways that cannot easily be captured using simpler analytic models, due to interdependencies between the effects of switch and site failures on system configuration
Keywords :
Monte Carlo methods; VLSI; integrated memory circuits; pipeline processing; Monte Carlo simulations; configuration requirements; pipelined memory; site failures; site yields; soft-configurable WSI; switch failures; switch path bypasses; switch yields; Circuit faults; Failure analysis; Fault tolerance; Monte Carlo methods; Predictive models; Prototypes; Semiconductor device modeling; Switches; Testing; Wafer scale integration;
Conference_Titel :
Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9126-3
DOI :
10.1109/ICWSI.1991.151702
