DocumentCode :
2161655
Title :
New passive all-optical semiconductor device for bit-1 level noise reduction
Author :
Nguyen, Trung H. ; Oudar, J.-L. ; Sauvage, S. ; Bouchoule, S. ; Aubin, G.
Author_Institution :
CNRS-LPN, Marcoussis
fYear :
2007
fDate :
17-22 June 2007
Firstpage :
1
Lastpage :
1
Abstract :
This paper proposes and demonstrates a new configuration of SA-based microcavity that can achieve the required bit-1 level stabilisation. It is based on a simple variation of the well-known reflection-mode SA microcavity used for extinction ratio enhancement, with cavity parameters designed for obtaining a decreasing curve of reflectance vs input power, while an increasing curve is obtained with the usual design. Therefore it can be used with similar multiple quantum well (QW) structures, whose carrier lifetime can be reduced by introducing capture and recombination centers via low temperature epitaxy, high-energy ion implantation, Be or Fe doping, etc.
Keywords :
carrier lifetime; microcavities; optical repeaters; optical saturable absorption; reflectivity; semiconductor device noise; all-optical regenerators; bit-1 level noise reduction; capture centers; doping; extinction ratio; high-energy ion implantation; low temperature epitaxy; multiple quantum well structures; passive all-optical semiconductor device; recombination centers; reflectance; reflection-mode saturable absorber microcavity; Charge carrier lifetime; Epitaxial growth; Extinction ratio; Ion implantation; Microcavities; Noise reduction; Radiative recombination; Reflectivity; Semiconductor devices; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-0931-0
Electronic_ISBN :
978-1-4244-0931-0
Type :
conf
DOI :
10.1109/CLEOE-IQEC.2007.4386418
Filename :
4386418
Link To Document :
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