Title :
Innovations in microwave measurement
Author :
Hayden, Linda ; Henderson, Robert
Abstract :
Presents an abstract for the session paper for the above titled paper.
Keywords :
Dielectric measurements; Error analysis; Fixtures; Measurement errors; Microwave measurements; Millimeter wave measurements; Probes; Technological innovation;
Conference_Titel :
Microwave Symposium Digest, 2005 IEEE MTT-S International
Conference_Location :
Long Beach, CA
Print_ISBN :
0-7803-8845-3
DOI :
10.1109/MWSYM.2005.1517028
