• DocumentCode
    2161770
  • Title

    Structures for a configuration and self-configuration of WSI systems with a low degree of regularity

  • Author

    Iden, Hans-Jürgen M.

  • Author_Institution
    Lab. fuer Informationstechnol., Hannover Univ., Germany
  • fYear
    1991
  • fDate
    29-31 Jan 1991
  • Firstpage
    104
  • Lastpage
    111
  • Abstract
    For WSI (wafer scale integration) systems with a low degree of regularity, a design strategy is investigated which features a self-configuration. Redundant arrangements of modules as well as implementations of subsidiary circuitry are presented. They provide a multiple defect tolerance even for central circuitry such as system control, test, and configuration circuitry. The components are implemented in a WSI system (~16 cm2) which is still under production. Due to the modular nature of these components, they may be applied to other complex redundant systems. The efficiency of the proposed solutions is confirmed by the results of yield calculations
  • Keywords
    VLSI; digital signal processing chips; modules; redundancy; WSI systems; complex redundant systems; configuration; design strategy; modular nature; multiple defect tolerance; regularity; self-configuration; subsidiary circuitry; Automatic testing; Built-in self-test; Circuit testing; Control systems; Hardware; Performance evaluation; Redundancy; Registers; System testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-8186-9126-3
  • Type

    conf

  • DOI
    10.1109/ICWSI.1991.151703
  • Filename
    151703