DocumentCode :
2161770
Title :
Structures for a configuration and self-configuration of WSI systems with a low degree of regularity
Author :
Iden, Hans-Jürgen M.
Author_Institution :
Lab. fuer Informationstechnol., Hannover Univ., Germany
fYear :
1991
fDate :
29-31 Jan 1991
Firstpage :
104
Lastpage :
111
Abstract :
For WSI (wafer scale integration) systems with a low degree of regularity, a design strategy is investigated which features a self-configuration. Redundant arrangements of modules as well as implementations of subsidiary circuitry are presented. They provide a multiple defect tolerance even for central circuitry such as system control, test, and configuration circuitry. The components are implemented in a WSI system (~16 cm2) which is still under production. Due to the modular nature of these components, they may be applied to other complex redundant systems. The efficiency of the proposed solutions is confirmed by the results of yield calculations
Keywords :
VLSI; digital signal processing chips; modules; redundancy; WSI systems; complex redundant systems; configuration; design strategy; modular nature; multiple defect tolerance; regularity; self-configuration; subsidiary circuitry; Automatic testing; Built-in self-test; Circuit testing; Control systems; Hardware; Performance evaluation; Redundancy; Registers; System testing; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9126-3
Type :
conf
DOI :
10.1109/ICWSI.1991.151703
Filename :
151703
Link To Document :
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