DocumentCode :
2161848
Title :
Statistical analysis of random errors from calibration standards
Author :
Chen, Xiaoming
Author_Institution :
Microelectron. Eng., BreconRidge Manuf. Solutions, Ottawa, Ont., Canada
fYear :
2005
fDate :
12-17 June 2005
Abstract :
This paper presents the results of error estimation caused by the VNA calibration standards using StatistiCAL designed at NIST. A GCPW-stripline-GCPW type transition and a test fixture for transceiver module testing are chosen to do the study over 8 to 12 GHz. Calibration standards, that is through, lines and shorts are fabricated in-house. The electromagnetic modeling needed in the development of the calibration standards is done through Ansoft HFSS. The results are used to verify HFSS simulations and they are effectively applied to module testing and performance screening.
Keywords :
calibration; coplanar waveguides; error analysis; measurement standards; microwave measurement; network analysers; statistical analysis; strip lines; transceivers; waveguide transitions; 8 to 12 GHz; GCPW stripline; GCPW type transition; StatistiCAL calibration standards; VNA calibration standards; electromagnetic modeling; error estimation; random errors; scattering parameters; statistical error analysis; transceiver module testing; vector network analyzers; Calibration; Ceramics; Electromagnetic modeling; Electronics packaging; Frequency; Measurement standards; Scattering parameters; Standards development; Statistical analysis; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2005 IEEE MTT-S International
ISSN :
01490-645X
Print_ISBN :
0-7803-8845-3
Type :
conf
DOI :
10.1109/MWSYM.2005.1517032
Filename :
1517032
Link To Document :
بازگشت