DocumentCode :
2161863
Title :
Split gate cell with phonon assisted ballistic CHE injection
Author :
Saito, T. ; Ogura, S. ; Ogura, T. ; Yuda, T. ; Kawazu, Y. ; Ikegami, M. ; Uchiyama, A. ; Ono, T.
Author_Institution :
Halo LSI Inc., Wappingers Falls, NY, USA
fYear :
2000
fDate :
13-15 June 2000
Firstpage :
126
Lastpage :
127
Abstract :
A planar channel split floating gate memory cell with an ultra short channel of <40 nm (within 3-4/spl times/ of the electron mean free path) is presented, in which high energy channel hot electrons generated by ballistic channel transport can be injected by phonon scattering with slight energy loss. This planar channel device can match the <1 /spl mu/s program speed of the previously reported step channel ballistic device at the same low voltages of Vd=5 V, Vcg=5 V. The structural differences between a planar and step channel are evaluated.
Keywords :
CMOS digital integrated circuits; cellular arrays; flash memories; high field effects; hot carriers; integrated circuit design; low-power electronics; 5 V; CMOS; channel hot electrons; energy loss; flash memory; low-voltage operation; phonon assisted ballistic CHE injection; phonon scattering; planar channel; planar channel split floating gate memory cell; split gate cell; step channel; structural differences; ultra short channel; Boron; Channel hot electron injection; Fabrication; Large scale integration; Logic programming; Nonvolatile memory; Phonons; Production; Scattering; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 2000. Digest of Technical Papers. 2000 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-6305-1
Type :
conf
DOI :
10.1109/VLSIT.2000.852796
Filename :
852796
Link To Document :
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