• DocumentCode
    2162002
  • Title

    Texture-wavelet analysis for automating wind damage detection from aerial imageries

  • Author

    Radhika, S. ; Tamura, Yoshinobu ; Matsui, Masaki

  • Author_Institution
    Electron. & Commun. Dept., Jaypee Univ. of Eng. & Technol., Guna, India
  • fYear
    2013
  • fDate
    22-23 Feb. 2013
  • Firstpage
    1246
  • Lastpage
    1250
  • Abstract
    In this era of climatic changes, heavy wind damages to buildings and structures have become a major issue. Impacts of such disasters can be reduced by a rapid but accurate identification of damaged location and faster reconstruction. In this paper, automatic roof-damaged building identification as well as the damaged area pattern recognition is carried out from aerial images using a novel technique, texture-wavelet analysis. Initially, wavelet features extraction, followed by feature selection using a decision tree algorithm and Support Vector Machine (SVM) classification is performed for roof-damaged building identification. After separating the damaged buildings from the non-damaged ones, the pattern of the roof-damaged area is attained using texture-wavelet analysis and finally percentage area of damaged roof is measured. Comparison is done with the conventional feature extraction methods. The validation is performed with the manually obtained data as well as the field survey information.
  • Keywords
    buildings (structures); decision trees; feature extraction; image classification; image texture; reliability; roofs; structural engineering computing; support vector machines; wavelet transforms; wind; SVM classification; aerial image; automatic roof-damaged building identification; damaged area pattern recognition; decision tree algorithm; feature selection; support vector machine; texture-wavelet analysis; wavelet feature extraction; wind damage detection; Area measurement; Buildings; Feature extraction; Image edge detection; Support vector machines; Tornadoes; Wavelet analysis; Aerial Images; Decision Tree; Support Vector Machine (SVM); Texture-wavelet Analysis; Wavelet feature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advance Computing Conference (IACC), 2013 IEEE 3rd International
  • Conference_Location
    Ghaziabad
  • Print_ISBN
    978-1-4673-4527-9
  • Type

    conf

  • DOI
    10.1109/IAdCC.2013.6514406
  • Filename
    6514406