Title :
Ion trapping in the CESR B-factory
Author :
Sagan, David ; Orlov, Yuri
Author_Institution :
Lab. of Nucl. Studies, Cornell Univ., Ithaca, NY, USA
Abstract :
Analysis of the ion trapping expected for the Cornell B-factory shows that the presence of 10% gap in the bunch train will be very effective in reducing the ultimate ion density. With a gap the average ion lifetime is seen from simulations to be under 10/sup -5/ seconds or about a few turns. While the average lifetime is short both simulation an analysis show that there exists near the center of the beam a small core of long lived ions. The resulting ion density distribution is then substantially different from the (Gaussian) beam distribution.<>
Keywords :
electron accelerators; particle beam diagnostics; storage rings; CESR; Cornell B-factory; bunch train; ion density; ion lifetime; ion trapping; particle beam diagnostics; Analytical models; Electrodes; Electron beams; Electron traps; Frequency; Laboratories; Lattices; Production facilities; Stability; Storage rings;
Conference_Titel :
Particle Accelerator Conference, 1991. Accelerator Science and Technology., Conference Record of the 1991 IEEE
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-0135-8
DOI :
10.1109/PAC.1991.164795
