• DocumentCode
    2162064
  • Title

    Ion trapping in the CESR B-factory

  • Author

    Sagan, David ; Orlov, Yuri

  • Author_Institution
    Lab. of Nucl. Studies, Cornell Univ., Ithaca, NY, USA
  • fYear
    1991
  • fDate
    6-9 May 1991
  • Firstpage
    1839
  • Abstract
    Analysis of the ion trapping expected for the Cornell B-factory shows that the presence of 10% gap in the bunch train will be very effective in reducing the ultimate ion density. With a gap the average ion lifetime is seen from simulations to be under 10/sup -5/ seconds or about a few turns. While the average lifetime is short both simulation an analysis show that there exists near the center of the beam a small core of long lived ions. The resulting ion density distribution is then substantially different from the (Gaussian) beam distribution.<>
  • Keywords
    electron accelerators; particle beam diagnostics; storage rings; CESR; Cornell B-factory; bunch train; ion density; ion lifetime; ion trapping; particle beam diagnostics; Analytical models; Electrodes; Electron beams; Electron traps; Frequency; Laboratories; Lattices; Production facilities; Stability; Storage rings;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 1991. Accelerator Science and Technology., Conference Record of the 1991 IEEE
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-0135-8
  • Type

    conf

  • DOI
    10.1109/PAC.1991.164795
  • Filename
    164795