DocumentCode
2162374
Title
A parameter estimation algorithm for propagation channels based on two-layer evidence framework
Author
Yin, Xuefeng ; Hu, Yuandong ; Zeng, Zhen ; Zhou, Junhe ; Tong, Meisong ; Zhong, Zhimeng ; Lu, Stan X.
Author_Institution
Coll. of Electron. & Inf. Eng., Tongji Univ., Shanghai, China
fYear
2012
fDate
8-14 July 2012
Firstpage
1
Lastpage
2
Abstract
In this contribution, a new algorithm derived based on a two-layer evidence framework is applied to estimating parameters in the generic stochastic channel models from measurement data. Different from conventional high-resolution parameter estimation algorithms, e.g. the space-alternating generalized expectation-maximization (SAGE), the method proposed is applicable to extracting both the parameters of multiple components in individual realizations of channel impulse responses and the statistical parameters of the wide-sense-stationary channel. Furthermore, the proposed two-layer evidence framework can be readily generalized to accommodate appropriate channel features of interest as certain prior information. Preliminary simulation results demonstrate the effectiveness of the proposed algorithm when being used to estimate the cumulative distribution function of delay spreads of propagation channels.
Keywords
channel estimation; expectation-maximisation algorithm; statistical distributions; stochastic processes; transient response; SAGE; channel impulse responses; delay spreads; generic stochastic channel models; high-resolution parameter estimation algorithms; measurement data; propagation channels; space-alternating generalized expectation-maximization; statistical parameters; two-layer evidence framework; wide-sense-stationary channel; Channel estimation; Channel models; Delay; Estimation; Parameter estimation; Signal processing algorithms; Stochastic processes; Propagation channel; parameter estimation; stochastic channel modeling and evidence framework;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
Conference_Location
Chicago, IL
ISSN
1522-3965
Print_ISBN
978-1-4673-0461-0
Type
conf
DOI
10.1109/APS.2012.6349350
Filename
6349350
Link To Document