DocumentCode :
2162544
Title :
A partially-depleted SOI compact model - formulation and parameter extraction
Author :
Fung, S.K.H. ; Wagner, L. ; Sherony, M. ; Zamdmer, N. ; Sleight, J. ; Michel, M. ; Leobandung, E. ; Lo, S.H. ; Chen, T.C. ; Assaderaghi, F.
Author_Institution :
Semicond. Res. & Dev. Center, IBM Corp., Hopewell Junction, NY, USA
fYear :
2000
fDate :
13-15 June 2000
Firstpage :
206
Lastpage :
207
Abstract :
As SOI technology advances into mainstream, an accurate and predictive compact model is necessary to ensure the success of VLSI chip design. This paper describes a compact model which contributes to the successful implementation of the sophisticated 660 MHz 64-bit PowerPC at its first design. This model captures all important SOI specific device characteristics and circuit behavior properly. The parameter extraction methodology, which is essential in achieving a highly accurate model, will be discussed. Verification results using a 0.18 um (1.5 V) high performance SOI CMOS technology will be presented.
Keywords :
CMOS digital integrated circuits; VLSI; integrated circuit design; integrated circuit modelling; microprocessor chips; silicon-on-insulator; 0.18 micron; 1.5 V; 64 bit; 660 MHz; PowerPC chip; VLSI design; compact model; parameter extraction; partially depleted SOI CMOS technology; CMOS technology; Impact ionization; Integrated circuit modeling; MOSFET circuits; Parameter extraction; Predictive models; Semiconductor device modeling; Semiconductor diodes; Semiconductor process modeling; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 2000. Digest of Technical Papers. 2000 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-6305-1
Type :
conf
DOI :
10.1109/VLSIT.2000.852827
Filename :
852827
Link To Document :
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