Title :
Domain characterization of transmission line models for efficient simulation
Author :
Gupta, Rohini ; Kim, Seok-Yoon ; Pillage, Lawrence T.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Abstract :
Electronic system design requires simulating combinations of lossy, low-loss, frequency dependent, and coupled transmission lines. Accuracy and efficiency considerations would suggest the use of different models and analyses for the various types of interconnects. Toward this goal this paper presents an efficient methodology for characterizing transmission line models into solution domains. Specifically, given an acceptable percentage modeling error, analysis domains are established for automatic model selection between method of characteristics and a lumped modeling approach
Keywords :
VLSI; circuit analysis computing; error analysis; integrated circuit technology; transmission lines; analysis domains; automatic model selection; coupled transmission lines; domain characterization; electronic system design; interconnects; lumped modeling approach; solution domains; transmission line models; Analytical models; Computational modeling; Computer simulation; Contracts; Differential equations; Distributed parameter circuits; Error analysis; Integrated circuit interconnections; Propagation losses; Transmission lines;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1994. ICCD '94. Proceedings., IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-6565-3
DOI :
10.1109/ICCD.1994.331975