DocumentCode
2162844
Title
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224)
fYear
2001
fDate
2-5 Dec. 2001
Abstract
Conference proceedings front matter may contain various advertisements, welcome messages, committee or program information, and other miscellaneous conference information. This may in some cases also include the cover art, table of contents, copyright statements, title-page or half title-pages, blank pages, venue maps or other general information relating to the conference that was part of the original conference proceedings.
Keywords
semiconductor devices; CMOS devices; compound semiconductors; detectors; displays; electron devices; integrated circuit manufacturing; interconnect reliability; process technology; quantum electronics; sensors; simulation models; solid-state devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International
Conference_Location
Washington, DC, USA
Print_ISBN
0-7803-7050-3
Type
conf
DOI
10.1109/IEDM.2001.979359
Filename
979359
Link To Document