Title :
Reconfiguration of binary trees: the flow-driven approach
Author :
Antola, Anna ; Scarabottolo, Nello
Author_Institution :
Dipartimento di Elettronica, Politecnico di Milano, Italy
Abstract :
A novel reconfiguration technique for defect and fault tolerance in binary trees is presented. The reconfiguration scheme, based on spare elements distributed inside the tree, allows one to increase the probability of reconfiguration, resulting in an extremely reliable final structure. Quantitative evaluations of the effectiveness of the reconfiguration technique (i.e. probability of surviving different numbers of faults) and of the reliability of the redundant trees are given
Keywords :
VLSI; fault tolerant computing; probability; trees (mathematics); binary trees; defect tolerance; fault tolerance; flow-driven approach; probability; reconfiguration technique; redundant trees; reliability; spare elements; Binary trees; Fault tolerance; Functional programming; Multiprocessor interconnection networks; Runtime; Tree data structures; Wafer scale integration;
Conference_Titel :
Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9126-3
DOI :
10.1109/ICWSI.1991.151708
