DocumentCode
2163095
Title
Increasing the speed of microstrip line-type PDLC devices
Author
Utsumi, Yozo ; Kamei, Toshihisa ; Saito, Katsuhiko ; Moritake, Hiroshi
Author_Institution
National Defense Acad., Kanagawa, Japan
fYear
2005
fDate
12-17 June 2005
Abstract
We measure how the microwave band dielectric properties and response time characteristics of microstrip line-type PDLC (polymer dispersed liquid crystal) devices vary with polymer concentration, and we measure how their response time characteristics vary with the thickness of the PDLC layer. The physical significance of these results is also examined. With a layer thickness of 50 μm, an applied voltage of 100 V and a polymer concentration of 7 wt%, we show that the decay time can be reduced to about 1/30th that of a plain liquid crystal at the expense of an increase in rise time of about 2.5 times and a deterioration of dielectric birefringence of about 50%. Also, by varying the PDLC layer thickness with a polymer concentration of 5 wt% and an applied electric field fixed at 1.8 × 106 V/m, we show that increasing the layer thickness causes the decay time to increase and the rise time to decrease. The rise time obtained with a PDLC layer thickness of 100 μm is half the value obtained with a thickness of 20 μm, while the decay time is approximately 3.6 times larger.
Keywords
birefringence; liquid crystal devices; microstrip lines; microstrip resonators; polymer dispersed liquid crystals; 100 V; 100 micron; 50 micron; PDLC devices; decay time; delay lines; dielectric birefringence; microstrip line; microstrip resonators; microwave band dielectric properties; plain liquid crystal; polymer concentration; polymer dispersed liquid crystal devices; response time characteristics; rise time; Delay; Dielectric liquids; Dielectric measurements; Liquid crystal devices; Liquid crystal polymers; Microstrip; Microwave bands; Microwave measurements; Thickness measurement; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2005 IEEE MTT-S International
ISSN
01490-645X
Print_ISBN
0-7803-8845-3
Type
conf
DOI
10.1109/MWSYM.2005.1517083
Filename
1517083
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