DocumentCode
2163415
Title
Addressing ESD for microprocessors and ASICs in 21st century technologies
Author
Amerasekera, A.
Author_Institution
Texas Instrum. Inc., Dallas, TX, USA
fYear
2000
fDate
15-17 June 2000
Firstpage
84
Lastpage
87
Abstract
In this paper we review the present approaches to ESD for microprocessors and ASICs, and the different requirements and constraints for these chips. The evolution of these requirements in the next generations of ICs is discussed.
Keywords
Application specific integrated circuits; Electrostatic discharge; Integrated circuit design; Integrated circuit reliability; Microprocessor chips; ASICs; ESD; IC design; constraints; microprocessors; next-generation ICs; Application specific integrated circuits; Bipolar transistors; Breakdown voltage; Clamps; Costs; Electrostatic discharge; Impedance; Microprocessors; Protection; Thyristors;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 2000. Digest of Technical Papers. 2000 Symposium on
Conference_Location
Honolulu, HI, USA
Print_ISBN
0-7803-6309-4
Type
conf
DOI
10.1109/VLSIC.2000.852858
Filename
852858
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