Title :
Addressing ESD for microprocessors and ASICs in 21st century technologies
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
In this paper we review the present approaches to ESD for microprocessors and ASICs, and the different requirements and constraints for these chips. The evolution of these requirements in the next generations of ICs is discussed.
Keywords :
Application specific integrated circuits; Electrostatic discharge; Integrated circuit design; Integrated circuit reliability; Microprocessor chips; ASICs; ESD; IC design; constraints; microprocessors; next-generation ICs; Application specific integrated circuits; Bipolar transistors; Breakdown voltage; Clamps; Costs; Electrostatic discharge; Impedance; Microprocessors; Protection; Thyristors;
Conference_Titel :
VLSI Circuits, 2000. Digest of Technical Papers. 2000 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-6309-4
DOI :
10.1109/VLSIC.2000.852858
