• DocumentCode
    2163415
  • Title

    Addressing ESD for microprocessors and ASICs in 21st century technologies

  • Author

    Amerasekera, A.

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    2000
  • fDate
    15-17 June 2000
  • Firstpage
    84
  • Lastpage
    87
  • Abstract
    In this paper we review the present approaches to ESD for microprocessors and ASICs, and the different requirements and constraints for these chips. The evolution of these requirements in the next generations of ICs is discussed.
  • Keywords
    Application specific integrated circuits; Electrostatic discharge; Integrated circuit design; Integrated circuit reliability; Microprocessor chips; ASICs; ESD; IC design; constraints; microprocessors; next-generation ICs; Application specific integrated circuits; Bipolar transistors; Breakdown voltage; Clamps; Costs; Electrostatic discharge; Impedance; Microprocessors; Protection; Thyristors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 2000. Digest of Technical Papers. 2000 Symposium on
  • Conference_Location
    Honolulu, HI, USA
  • Print_ISBN
    0-7803-6309-4
  • Type

    conf

  • DOI
    10.1109/VLSIC.2000.852858
  • Filename
    852858