Title :
Mirrors and anti-reflective surfaces in single crystal silicon by patterning of the silicon surface
Author :
Hadzialic, Sanja ; Taklo, Maaike M. V.
Author_Institution :
SINTEF ICT, Oslo, Norway
Abstract :
We present mirrors and anti-reflective (AR) surfaces based on micro-structuring of silicon. Compared to dielectric Bragg reflector mirrors and thin film AR-coatings these structures are thinner, result in less material stress, and are compatible with CMOS technology (all silicon). Our surface structures are optimized for the 7-14 μm wavelength range. Such structures have applications within fields of infrared imaging, alcoholmeters, and cooling and anesthesia gas-detectors.
Keywords :
antireflection coatings; elemental semiconductors; mirrors; optical films; silicon; surface structure; CMOS technology; Si; alcoholmeters; anesthesia gas-detectors; antireflective surfaces; cooling; dielectric Bragg reflector mirrors; infrared imaging; material stress; microstructuring process; silicon surface patterning; single crystal silicon; surface structure; thin film AR-coatings; wavelength 7 mum to 14 mum; Detectors; Mirrors; Optical surface waves; Reflectivity; Silicon; Surface waves;
Conference_Titel :
Optical MEMS and Nanophotonics (OMN), 2013 International Conference on
Conference_Location :
Kanazawa
Print_ISBN :
978-1-4799-1512-5
DOI :
10.1109/OMN.2013.6659061