DocumentCode
2163551
Title
A next generation channeled-DRAM architecture with direct background-operation and delayed channel-replacement techniques
Author
Yabe, Y. ; Nakamura, N. ; Aimoto, Y. ; Motomura, M. ; Matsui, Y. ; Adakura, Y.
Author_Institution
Silicon Syst. Res. Lab., NEC Corp., Sagamihara, Japan
fYear
2000
fDate
15-17 June 2000
Firstpage
108
Lastpage
111
Abstract
As processor performance is reaching the level of executing a single instruction in 1 ns, long memory latencies have become a critical problem, because a single memory access could stall the execution of hundreds of instructions. A recently announced channeled-DRAM approaches this problem by integrating a small low-latency buffer, called "channels", in front of a DRAM core in order to reduce the effective memory latency. Since the channels can provide intrinsically faster access than that of a bare DRAM core when they hit, key considerations in this architecture become (1) how to achieve high channel hit rates and (2) how to reduce the channel-miss latencies. Since channeled-DRAMs rely on an external memory controller to handle all the channel management, design of the memory controller heavily dominates the first issue. In this paper, we propose two novel techniques for reducing the channel-miss latencies: direct background operation and delayed channel replacement. We examined these techniques in a future 256-Mb DRAM with a 200-MHz double-data-rate (DDR) synchronous interface. Both SPICE simulation results (that show channel-miss latency reduction) and system-level simulation results (that reveal system-level performance improvement) are presented.
Keywords
DRAM chips; Delays; Memory architecture; 1 ns; 200 MHz; 256 Mbit; DRAM core; SPICE simulation; channel hit rates; channel management; channel-miss latencies; channeled-DRAM architecture; delayed channel replacement; direct background operation; double-data-rate synchronous interface; external memory controller; low-latency buffer; memory access; memory latency; processor performance; system-level performance improvement; system-level simulation; Bandwidth; Delay; Graphics; Laboratories; Large scale integration; Memory management; National electric code; Prefetching; Random access memory; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 2000. Digest of Technical Papers. 2000 Symposium on
Conference_Location
Honolulu, HI, USA
Print_ISBN
0-7803-6309-4
Type
conf
DOI
10.1109/VLSIC.2000.852864
Filename
852864
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