Title :
Making precise at-speed timing measurements via boundary-scan
Author_Institution :
Tektronix Inc., Beaverton, OR, USA
Abstract :
IEEE 1149.1 Boundary-Scan has traditionally been used for continuity and low speed functional testing of integrated circuits. The boundary-scan RUNBIST instruction allows Built-In Self Test for functional testing at full clock speeds. This paper describes an approach that uses the RUNBIST instruction to make timing measurements with a resolution 32 times smaller than the clock period while doing at-speed testing. Measurement commands and results are transmitted via boundary-scan
Keywords :
boundary scan testing; built-in self test; integrated circuit testing; timing; IEEE 1149.1; RUNBIST instruction; at-speed timing measurement; boundary-scan; built-in self test; functional testing; integrated circuit; Application specific integrated circuits; Automatic testing; Circuit synthesis; Circuit testing; Clocks; Delay; Integrated circuit measurements; Logic; Signal analysis; Timing;
Conference_Titel :
Custom Integrated Circuits Conference, 1997., Proceedings of the IEEE 1997
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3669-0
DOI :
10.1109/CICC.1997.606614
