DocumentCode :
2163779
Title :
VHDL-based design and analysis of defect tolerant VLSI/WSI array architectures
Author :
Kuo, Sy-Yen ; Wang, Kuochen
Author_Institution :
Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
fYear :
1991
fDate :
29-31 Jan 1991
Firstpage :
163
Lastpage :
169
Abstract :
Presents an integrated computer-aided design environment, the VAR (VHDL-based array reconfiguration) system, for the design, diagnosis, reconfiguration, simulation, and evaluation of an array architecture described in VHDL. VAR allows one to study fault diagnosis and reconfiguration algorithms by inserting user-defined faults into the array and then locating the faulty processing elements as well as simulating the actual reconfiguration process by mapping a target array onto a host array. Thus, VAR can assist the designer in evaluating different combinations of diagnosis algorithms, reconfiguration algorithms, and reconfigurable architectures
Keywords :
VLSI; circuit CAD; digital simulation; parallel architectures; specification languages; systolic arrays; VAR; VHDL-based array reconfiguration; computer-aided design environment; defect tolerant VLSI/WSI array architectures; diagnosis; fault diagnosis; faulty processing elements; host array; reconfiguration; reconfiguration algorithms; simulation; target array; user-defined faults; Algorithm design and analysis; Computational modeling; Computer simulation; Design automation; Fault diagnosis; Performance analysis; Reactive power; Reconfigurable architectures; Switches; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9126-3
Type :
conf
DOI :
10.1109/ICWSI.1991.151711
Filename :
151711
Link To Document :
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