DocumentCode :
2164019
Title :
Glass reflow process for an electrical isolation and temporary support of two-dimensional microscanner
Author :
Minyoung Yun ; Daehun Jeong ; Seunghwan Moon ; Jong-Hyun Lee
Author_Institution :
Gwangju Inst. of Sci. & Technol., Gwangju, South Korea
fYear :
2013
fDate :
18-22 Aug. 2013
Firstpage :
111
Lastpage :
112
Abstract :
In a two-dimensional (2-D) electrostatic microscanner, electrical isolation for separating the current paths of the 2-D actuator and temporary support for enhancing the reliability of the scanner fabrication are still major issues. In this paper, a glass reflow process was proposed to achieve both electrical isolation and temporary support. The glass was successfully reflowed into the silicon trenches with various widths (15 μm, 25 μm and 35 μm) and lengths (25 μm, 50 μm and 100 μm), which will be also evaluated in terms of breakdown voltage and fabrication yield.
Keywords :
elemental semiconductors; micro-optics; optical fabrication; reliability; silicon; 2D actuator; Si; breakdown voltage; electrical isolation; glass reflow process; reliability; scanner fabrication; silicon trenches; size 15 mum to 100 mum; temporary support; two-dimensional electrostatic microscanner; Biomedical optical imaging; Filling; Glass; Optical device fabrication; Optical imaging; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical MEMS and Nanophotonics (OMN), 2013 International Conference on
Conference_Location :
Kanazawa
ISSN :
2160-5033
Print_ISBN :
978-1-4799-1512-5
Type :
conf
DOI :
10.1109/OMN.2013.6659084
Filename :
6659084
Link To Document :
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