DocumentCode
2164139
Title
Photochemical polishing of sapphire substrate based on nonadiabatic optical near-field etching
Author
Suzuki, Jun ; Hirata, Kazufumi ; Iwami, Kentaro ; Taguchi, Akira ; Umeda, Norihiro
Author_Institution
Tokyo Univ. of Agric. & Technol., Koganei, Japan
fYear
2013
fDate
18-22 Aug. 2013
Firstpage
121
Lastpage
122
Abstract
In this study, photochemical polishing based on a nonadiabatic optical near-field etching to sapphire substrate is studied. A sapphire substrate with an initial roughness of Ra=6.00 nm was polished by 100 Pa Cl2 gas atmosphere under laser irradiation for 60 minutes, and smoothened into Ra= 1.91 nm. Due to the Gaussian intensity distribution in the laser beam section, there was in-plane distribution of surface roughness. Furthermore, etching time got longer, the roughness was increased. This result suggests nonadiabatic optical near-field etching to sapphire substrate has an optimal etching time, which agrees with a result of SiO2 substrate.
Keywords
Gaussian distribution; laser beam etching; micro-optomechanical devices; optical fabrication; polishing; sapphire; substrates; surface roughness; Al2O3; Gaussian intensity distribution; MEMS; gas atmosphere; laser beam section; laser irradiation; nonadiabatic optical near-field etching; photochemical polishing; sapphire substrate; surface roughness; time 60 min; Etching; Optical device fabrication; Optical sensors; Rough surfaces; Substrates; Surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical MEMS and Nanophotonics (OMN), 2013 International Conference on
Conference_Location
Kanazawa
ISSN
2160-5033
Print_ISBN
978-1-4799-1512-5
Type
conf
DOI
10.1109/OMN.2013.6659089
Filename
6659089
Link To Document