• DocumentCode
    2164139
  • Title

    Photochemical polishing of sapphire substrate based on nonadiabatic optical near-field etching

  • Author

    Suzuki, Jun ; Hirata, Kazufumi ; Iwami, Kentaro ; Taguchi, Akira ; Umeda, Norihiro

  • Author_Institution
    Tokyo Univ. of Agric. & Technol., Koganei, Japan
  • fYear
    2013
  • fDate
    18-22 Aug. 2013
  • Firstpage
    121
  • Lastpage
    122
  • Abstract
    In this study, photochemical polishing based on a nonadiabatic optical near-field etching to sapphire substrate is studied. A sapphire substrate with an initial roughness of Ra=6.00 nm was polished by 100 Pa Cl2 gas atmosphere under laser irradiation for 60 minutes, and smoothened into Ra= 1.91 nm. Due to the Gaussian intensity distribution in the laser beam section, there was in-plane distribution of surface roughness. Furthermore, etching time got longer, the roughness was increased. This result suggests nonadiabatic optical near-field etching to sapphire substrate has an optimal etching time, which agrees with a result of SiO2 substrate.
  • Keywords
    Gaussian distribution; laser beam etching; micro-optomechanical devices; optical fabrication; polishing; sapphire; substrates; surface roughness; Al2O3; Gaussian intensity distribution; MEMS; gas atmosphere; laser beam section; laser irradiation; nonadiabatic optical near-field etching; photochemical polishing; sapphire substrate; surface roughness; time 60 min; Etching; Optical device fabrication; Optical sensors; Rough surfaces; Substrates; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical MEMS and Nanophotonics (OMN), 2013 International Conference on
  • Conference_Location
    Kanazawa
  • ISSN
    2160-5033
  • Print_ISBN
    978-1-4799-1512-5
  • Type

    conf

  • DOI
    10.1109/OMN.2013.6659089
  • Filename
    6659089