DocumentCode :
2164244
Title :
Theoretical analyses of chemical reactions for forming hydrocarbon-bridged SiOCH low-k Films in PECVD processes
Author :
Tajima, N. ; Ohashi, Y. ; Nagano, S. ; Xu, Y. ; Matsumoto, S. ; Kada, T. ; Ohno, T.
Author_Institution :
Nat. Inst. for Mater. Sci., Tsukuba
fYear :
2009
fDate :
1-3 June 2009
Firstpage :
116
Lastpage :
118
Abstract :
The advantages of the SiOCH low-k films with hydrocarbon cross-links (hydrocarbon bridges) Si-Cn-Si have been reported recently. However, hydrocarbon cross-links are not produced so selectively by the PECVD method, since the hydrocarbon components tend to form terminal atom groups such as Si-CH3. For producing hydrocarbon cross-links effectively by the PECVD method, the polymerization reactions of SiOCH precursors in the PECVD process should be understood well. We have theoretically examined the bonding reactions of the atom groups of SiOCH compounds. By examining the reactions involving radicals and ions, it has been found that the radical species Simiddot, Cmiddot, and Omiddot produce Si-O, C-Si, and O-Si bonds, respectively, while the ionic species produce Si-O bonds. These results suggest that the precursors should produce Si-Cnmiddot radicals preferably for the effective production of the hydrocarbon cross-links.
Keywords :
bonding processes; low-k dielectric thin films; plasma CVD; polymerisation; silicon compounds; O-Si bond; PECVD processes; SiOCH; atom groups; bonding reactions; chemical reactions; hydrocarbon cross-links; hydrocarbon-bridged low-k films; polymerization reactions; radical species; Atomic measurements; Bonding; Bridges; Chemical analysis; Chemical processes; Dielectric constant; Energy barrier; Hydrocarbons; Polymers; Production;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Interconnect Technology Conference, 2009. IITC 2009. IEEE International
Conference_Location :
Sapporo, Hokkaido
Print_ISBN :
978-1-4244-4492-2
Electronic_ISBN :
978-1-4244-4493-9
Type :
conf
DOI :
10.1109/IITC.2009.5090357
Filename :
5090357
Link To Document :
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