Title :
Broad-band, multi-harmonic frequency domain behavioral models from automated large-signal vectorial network measurements
Author :
Verspecht, Jan ; Root, David E. ; Wood, John ; Cognata, Alex
Author_Institution :
Jan Verspecht bvba, Steenhuffel, Belgium
Abstract :
This paper presents an extended nonlinear black-box behavioral model in the frequency domain, automated experimental identification of the model from large-signal vector network measurements, and extensive experimental validation of its application to real microwave ICs. The model is a broad-band extension of the multi-harmonic "linearized scattering function" theory. The characterization is based on large-signal vector network measurements where harmonic perturbations are applied, in phase and in quadrature, to a component excited at the input by a large amplitude tone. The experiment design and model generation are simple and highly automated. The derived model is shown to be valid for both small and large amplitude drive signals, correctly predict even and odd harmonics, and simulate, accurately, load-pull behavior far from 50 ohms. The model is implemented in Agilent ADS.
Keywords :
frequency-domain analysis; microwave integrated circuits; microwave measurement; network analysers; nonlinear network analysis; perturbation theory; 50 ohm; harmonic perturbation; large-signal vectorial network measurement; linearized scattering function; microwave integrated circuit; microwave measurement; multiharmonic frequency domain behavioral model; nonlinear black-box behavioral model; nonlinear circuit; Circuit simulation; Frequency domain analysis; Frequency measurement; Instruments; Microwave measurements; Microwave technology; Phase measurement; Predictive models; Scattering; USA Councils;
Conference_Titel :
Microwave Symposium Digest, 2005 IEEE MTT-S International
Print_ISBN :
0-7803-8845-3
DOI :
10.1109/MWSYM.2005.1517130