Nondestructive Imaging of Dielectric Objects using Band-Limited Noisy Scattering Data

A nondestructive method for imaging a spherical/planar dielectric object from the measurement of band-limited noisy scattering data is presented. The paper is divided in two parts. The first part deals with the direct problem formulation and its inversion for a higher order TE- mode illumination to accurately obtain the unknown permittivity profile of spherical objects in terms of the spherical Fourier-Besssel transform of noisy reflection coefficient data. In the second part, a novel algorithm is proposed to reconstruct the permittivity profile from band-limited scattering data. A number of examples has been considered and a good agreement between the actual and the reconstructed profiles under high noisy conditions as well as in terms of band-limited scattering data shows the validity of our proposed technique.