Title :
Prediction of error vector magnitude using AM/AM, AM/PM distortion of RF power amplifier for high order modulation OFDM system
Author :
Kim, Joon H. ; Jeong, Jae H. ; Kim, Seong M. ; Park, Chul S. ; Lee, Kwang C.
Author_Institution :
Electron. & Telecommun. Res. Inst., Daejeon, South Korea
Abstract :
This paper presents an analysis of error vector magnitude (EVM) performance of power amplifier using the amplitude/phase distortion coefficients derived from probability density function (PDF) of OFDM input signal. Amplitude coefficient values are calculated from the amplitude/phase distortion coefficients. The amplitude/phase distortion coefficient can be calculated from summation of the measured AM/AM (amplitude distortion) and AM/PM (phase distortion) data considered the probability of an input OFDM signal level. A complete analysis of the EVM model for output OFDM symbol with variable envelop through power amplifier can be derived from amplitude/phase distortion coefficients. To investigate, we use 1024(210) IFFT-OFDM signal based on 802.16e mobile system, 9.7dB peak to average power ratio (PAPR) at 0.01% CCDF and 10MHz overall occupation bandwidth, and the fabricated HBT MMIC power amplifier. The error ratio between the predicted EVM and measured EVM is as small as 1%.
Keywords :
III-V semiconductors; MMIC power amplifiers; OFDM modulation; amplitude modulation; arsenic compounds; bipolar MMIC; distortion; gallium arsenide; indium compounds; phase modulation; probability; 10 MHz; 802.16e mobile system; AM-AM distortion; AM-PM distortion; HBT MMIC power amplifier; IFFT-OFDM signal; InGaP-GaAs; OFDM system; RF power amplifiers; amplitude distortion coefficients; error vector magnitude prediction; high order modulation; input OFDM signal; output OFDM symbol; phase distortion coefficients; probability density function; Distortion measurement; Error analysis; High power amplifiers; OFDM modulation; Peak to average power ratio; Phase distortion; Power amplifiers; Radio frequency; Radiofrequency amplifiers; Signal analysis;
Conference_Titel :
Microwave Symposium Digest, 2005 IEEE MTT-S International
Print_ISBN :
0-7803-8845-3
DOI :
10.1109/MWSYM.2005.1517143