Title :
Carbon nanotube field effect transistors for logic applications
Author :
Martel, R. ; Wong, H.-S.P. ; Chan, K. ; Avouris, P.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
Presents new experimental data for single-wall carbon nanotube based field-effect transistors (CNFETs). New metal-nanotube contacts are shown to improve the performance of the CNFETs over previously reported values. Assuming conventional scaling, the improved device performance suggests that CNFETs may be competitive with Si-FETs and require no new circuit paradigm and architecture.
Keywords :
carbon nanotubes; chirality; dielectric thin films; field effect logic circuits; field effect transistors; passivation; CNFETs; carbon nanotube field effect transistors; circuit architecture; device performance; logic applications; metal-nanotube contacts; scaling; single-wall carbon nanotube; CNTFETs; Carbon nanotubes; Double-gate FETs; Electrodes; Logic; Semiconductivity; Silicon; Sociotechnical systems; Spectroscopy; Tunneling;
Conference_Titel :
Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-7050-3
DOI :
10.1109/IEDM.2001.979456