DocumentCode
2164827
Title
High Performances of X-Band Wave Absorber for TE and TM Polarizations using Transparent Resistive Film
Author
Hanazawa, M. ; Yokokawa, H. ; Hashimoto, O. ; Wada, K.
Author_Institution
Aoyama Gakuin University 6-16-1 Chitosedai, Setagaya-ku, 1578572 Tokyo, Japan
fYear
2001
fDate
24-26 Sept. 2001
Firstpage
1
Lastpage
4
Abstract
An X-band transparent wave absorber for TE and TM wave polarizations is examined theoretically and experimentally. In the case of both polarizations, the absorption of 20dB or more was obtained at the frequency ranging from 8.5 to 11.5 GHz, and the incident angle between 0 and 40 degrees under the target frequency of 10 GHz and the target incident angel of 20 degrees. The optical transmittivities of the presented wave absorber of about 80% or more was also obtained, as expected.
Keywords
Absorption; Frequency; Glass; Indium tin oxide; Optical films; Optical reflection; Plastic films; Polarization; Surface resistance; Tellurium;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2001. 31st European
Conference_Location
London, England
Type
conf
DOI
10.1109/EUMA.2001.339086
Filename
4140154
Link To Document