DocumentCode :
2164827
Title :
High Performances of X-Band Wave Absorber for TE and TM Polarizations using Transparent Resistive Film
Author :
Hanazawa, M. ; Yokokawa, H. ; Hashimoto, O. ; Wada, K.
Author_Institution :
Aoyama Gakuin University 6-16-1 Chitosedai, Setagaya-ku, 1578572 Tokyo, Japan
fYear :
2001
fDate :
24-26 Sept. 2001
Firstpage :
1
Lastpage :
4
Abstract :
An X-band transparent wave absorber for TE and TM wave polarizations is examined theoretically and experimentally. In the case of both polarizations, the absorption of 20dB or more was obtained at the frequency ranging from 8.5 to 11.5 GHz, and the incident angle between 0 and 40 degrees under the target frequency of 10 GHz and the target incident angel of 20 degrees. The optical transmittivities of the presented wave absorber of about 80% or more was also obtained, as expected.
Keywords :
Absorption; Frequency; Glass; Indium tin oxide; Optical films; Optical reflection; Plastic films; Polarization; Surface resistance; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2001. 31st European
Conference_Location :
London, England
Type :
conf
DOI :
10.1109/EUMA.2001.339086
Filename :
4140154
Link To Document :
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