Title :
Transient analysis of PCB EMC problem
Author :
Cui, Jian ; Zhang, Min
Author_Institution :
Modern Integrated Electromagn. Simulation R&D Center (MIEMS), Tongji Univ., Shanghai, China
Abstract :
In this paper, the partial element equivalent circuit (PEEC) and the finite integration technique (FIT) are employed individually to investigate the electromagnetic compatibility (EMC) problem of a printed circuit board (PCB). The metal-oxide-semiconductor field-effect transistor (MOSFET) on the PCB makes current noise which is caught and measured. A normalization method in FIT is introduced to study PCB radiation. As a cross check, the electric field results obtained by PEEC and FIT are compared. It is shown that they agree well with each other. Finally a system-level simulation with PCB and metallic enclosure is investigated in FIT as well.
Keywords :
MOSFET; electromagnetic compatibility; equivalent circuits; integration; printed circuits; transient analysis; PCB EMC problem; electromagnetic compatibility; finite integration technique; metal-oxide-semiconductor field-effect transistor; partial element equivalent circuit; printed circuit board; transient analysis; Circuit noise; Current measurement; Electromagnetic compatibility; Electromagnetic measurements; Equivalent circuits; FETs; MOSFET circuits; Noise measurement; Printed circuits; Transient analysis; EMC; FIT; PCB; PEEC; simulation;
Conference_Titel :
Antennas, Propagation and EM Theory, 2008. ISAPE 2008. 8th International Symposium on
Conference_Location :
Kunming
Print_ISBN :
978-1-4244-2192-3
Electronic_ISBN :
978-1-4244-2193-0
DOI :
10.1109/ISAPE.2008.4735419
