Title :
Analog integration in a 0.35 /spl mu/m Cu metal pitch, 0.1 /spl mu/m gate length, low-power digital CMOS technology
Author :
Chatterjee, A. ; Mosher, D. ; Sridhar, S. ; Kim, Y. ; Nandakumar, M. ; Aur, S.-W. ; Chen, Z. ; Madhani, P. ; Tang, S. ; Aggarwal, R. ; Ashburn, S. ; Shichijo, H.
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
This paper describes the integration of active and passive components to enable embedding analog circuits in an advanced digital CMOS technology developed for low standby power integrated circuits. Device design issues, device characteristics, and technology scaling are discussed in this context. The components include 1.5 V digital core CMOS, 1.5 V analog and 3.3 V I/O MOSFETs. In addition to these self-aligned MOSFETs we describe drain-extended transistors, DEnMOS and DEpMOS, where the drain extensions are formed using the well implants. A novel structure to improve the substrate collector, vertical pnp bipolar transistor is presented. The passive components described here are the n-poly on n-well capacitors and a polysilicon resistor with a low temperature coefficient of resistance, usually referred to as the zero-TCR resistor. The analog integration adds one extra mask used to block silicidation of the zero-TCR polysilicon resistor.
Keywords :
CMOS analogue integrated circuits; copper; integrated circuit metallisation; integrated circuit technology; low-power electronics; 0.1 micron; 0.35 micron; 1.5 V; 3.3 V; Cu metal pitch; DEnMOS; DEpMOS; active component; analog integration; device design; drain-extended transistor; embedded analog circuit; gate length; low standby power integrated circuit; low-power digital CMOS technology; mask; n-poly on n-well capacitor; passive component; polysilicon resistor; self-aligned MOSFET; silicidation; substrate collector; technology scaling; temperature coefficient of resistance; vertical pnp bipolar transistor; well implant; zero-TCR resistor; Analog circuits; Bipolar transistors; CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS technology; Implants; Integrated circuit technology; MOSFETs; Power integrated circuits; Resistors;
Conference_Titel :
Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-7050-3
DOI :
10.1109/IEDM.2001.979468