DocumentCode :
2165245
Title :
Structural disorder induced polarization and mode scrambling in Photonic Crystals
Author :
Rossi, A.D. ; Combrie, S. ; Tran, N.-V.-Q. ; Cassette, S. ; Hamel, P. ; Jaouen, Y. ; Gabet, R. ; Talneau, A.
Author_Institution :
Thales Res. & Technol., Palaiseau
fYear :
2007
fDate :
17-22 June 2007
Firstpage :
1
Lastpage :
1
Abstract :
The authors investigates the impact of structural disorder in line-defect photonic crystal waveguides through optical low-coherence reflectometry (OLCR). The potential of photonic crystal waveguides for dispersion engineering and, in particular, controlling the propagation delay was realised very early, however, the practical implementation of this beautiful concept had been hampered by severe technological and also theoretical difficulties, leading to unacceptable propagation losses. More recently, the proper design of line-defect waveguides on 2D Photonic Crystal slabs allowed an impressive reduction of propagation loss down to less than 10dB/cm, thus opening new perspectives in the field of optical processing. However, fabrication defects and, in particular, structural disorder and roughness still have a strong impact on propagation as the group velocity is decreased. Therefore, understanding disorder appears as a critical task in view of implementation of slow-light with photonic crystal technology.
Keywords :
light coherence; optical waveguides; photonic crystals; 2D photonic crystal slabs; dispersion engineering; line-defect photonic crystal waveguides; mode scrambling; optical low-coherence reflectometry; optical processing; photonic crystal technology; photonic crystals; propagation delay control; structural disorder induced polarization; Optical control; Optical design; Optical polarization; Optical waveguide components; Optical waveguide theory; Optical waveguides; Photonic crystals; Propagation delay; Propagation losses; Reflectometry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-0931-0
Electronic_ISBN :
978-1-4244-0931-0
Type :
conf
DOI :
10.1109/CLEOE-IQEC.2007.4386564
Filename :
4386564
Link To Document :
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