• DocumentCode
    2165575
  • Title

    Conductor roughness reduced low-loss coplanar waveguides on low resistivity silicon by employing magnetorheological finishing

  • Author

    Lee, Sang-No ; Yook, Jong-Gwan ; Park, Sung-Jun ; Lee, Joon-Ik ; Kim, Yong-Jun ; Lee, Sang-Jo

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
  • fYear
    2005
  • fDate
    12-17 June 2005
  • Abstract
    This paper presents a surface finishing method based on magnetorheological (MR) fluid to obtain low-loss coplanar waveguides on low resistivity silicon. CPWs with different lateral dimension but having identical 50 Ω characteristic impedance are evaluated. In addition, finite ground effects on CPW performances before and after magnetorheological finishing (MRF) are investigated. In all cases, CPWs treated with the MR fluid-based finishing method reveal much lower attenuation constants compared to original ones owing to reduced conductor roughness. The proposed MRF scheme can be applied to smoothen three dimensional high frequency structures and dramatically improve conductor roughness.
  • Keywords
    conductors (electric); coplanar waveguides; magnetic fluids; magnetorheology; silicon; surface finishing; surface roughness; 3D high frequency structures; 50 ohm; Si; attenuation constants; characteristic impedance; conductor roughness; finite ground effects; low loss coplanar waveguides; low resistivity silicon; magnetorheological finishing; magnetorheological fluid; surface finishing method; Attenuation; Conductivity; Conductors; Coplanar waveguides; Rough surfaces; Silicon; Surface finishing; Surface impedance; Surface roughness; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2005 IEEE MTT-S International
  • ISSN
    01490-645X
  • Print_ISBN
    0-7803-8845-3
  • Type

    conf

  • DOI
    10.1109/MWSYM.2005.1517175
  • Filename
    1517175