DocumentCode
2165575
Title
Conductor roughness reduced low-loss coplanar waveguides on low resistivity silicon by employing magnetorheological finishing
Author
Lee, Sang-No ; Yook, Jong-Gwan ; Park, Sung-Jun ; Lee, Joon-Ik ; Kim, Yong-Jun ; Lee, Sang-Jo
Author_Institution
Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
fYear
2005
fDate
12-17 June 2005
Abstract
This paper presents a surface finishing method based on magnetorheological (MR) fluid to obtain low-loss coplanar waveguides on low resistivity silicon. CPWs with different lateral dimension but having identical 50 Ω characteristic impedance are evaluated. In addition, finite ground effects on CPW performances before and after magnetorheological finishing (MRF) are investigated. In all cases, CPWs treated with the MR fluid-based finishing method reveal much lower attenuation constants compared to original ones owing to reduced conductor roughness. The proposed MRF scheme can be applied to smoothen three dimensional high frequency structures and dramatically improve conductor roughness.
Keywords
conductors (electric); coplanar waveguides; magnetic fluids; magnetorheology; silicon; surface finishing; surface roughness; 3D high frequency structures; 50 ohm; Si; attenuation constants; characteristic impedance; conductor roughness; finite ground effects; low loss coplanar waveguides; low resistivity silicon; magnetorheological finishing; magnetorheological fluid; surface finishing method; Attenuation; Conductivity; Conductors; Coplanar waveguides; Rough surfaces; Silicon; Surface finishing; Surface impedance; Surface roughness; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2005 IEEE MTT-S International
ISSN
01490-645X
Print_ISBN
0-7803-8845-3
Type
conf
DOI
10.1109/MWSYM.2005.1517175
Filename
1517175
Link To Document