DocumentCode
2165768
Title
TCAD software for ESD on-chip protection design
Author
Fichtner, W. ; Esmark, K. ; Stadler, W.
Author_Institution
Integrated Syst. Lab., Eidgenossische Tech. Hochschule, Zurich, Switzerland
fYear
2001
fDate
2-5 Dec. 2001
Abstract
Electrostatic discharges (ESD) have always been a serious problem in the semiconductor industry. The presence of high electric fields and the amount of energy dissipated by the semiconductor devices during an ESD can give rise to electric breakdown of sensitive isolation layers as well as local melting, which leads to a latent damage or even breakdown of the whole integrated circuit (IC). One measure to prevent the breakdown of the IC is to provide the product with an adequate ESD robustness by implementing a kind of lightning conductor in the form of a protection element on the product itself. This methodology is called on-chip ESD protection.
Keywords
circuit CAD; electrostatic discharge; integrated circuit design; semiconductor device breakdown; technology CAD (electronics); ESD; TCAD software; electric breakdown; latent damage; lightning conductor; local melting; on-chip protection design; protection element; robustness; sensitive isolation layers; Electric breakdown; Electronics industry; Electrostatic discharge; Integrated circuit measurements; Lead compounds; Lightning; Protection; Robustness; Semiconductor device breakdown; Semiconductor devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International
Conference_Location
Washington, DC, USA
Print_ISBN
0-7803-7050-3
Type
conf
DOI
10.1109/IEDM.2001.979493
Filename
979493
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