• DocumentCode
    2165768
  • Title

    TCAD software for ESD on-chip protection design

  • Author

    Fichtner, W. ; Esmark, K. ; Stadler, W.

  • Author_Institution
    Integrated Syst. Lab., Eidgenossische Tech. Hochschule, Zurich, Switzerland
  • fYear
    2001
  • fDate
    2-5 Dec. 2001
  • Abstract
    Electrostatic discharges (ESD) have always been a serious problem in the semiconductor industry. The presence of high electric fields and the amount of energy dissipated by the semiconductor devices during an ESD can give rise to electric breakdown of sensitive isolation layers as well as local melting, which leads to a latent damage or even breakdown of the whole integrated circuit (IC). One measure to prevent the breakdown of the IC is to provide the product with an adequate ESD robustness by implementing a kind of lightning conductor in the form of a protection element on the product itself. This methodology is called on-chip ESD protection.
  • Keywords
    circuit CAD; electrostatic discharge; integrated circuit design; semiconductor device breakdown; technology CAD (electronics); ESD; TCAD software; electric breakdown; latent damage; lightning conductor; local melting; on-chip protection design; protection element; robustness; sensitive isolation layers; Electric breakdown; Electronics industry; Electrostatic discharge; Integrated circuit measurements; Lead compounds; Lightning; Protection; Robustness; Semiconductor device breakdown; Semiconductor devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    0-7803-7050-3
  • Type

    conf

  • DOI
    10.1109/IEDM.2001.979493
  • Filename
    979493