Abstract :
The following topics were dealt with: error detection codes; error correction; self-checking circuits; radiation hardening; soft error detection; control-flow checking; fault-tolerance; error mitigation; memory self-test; memory self-repair; reliability; circuit simulation; on-line testing; networks-on-chip; labs-on-chip; multiport chips; parametric testing; self-test generation techniques and laser-based fault injection.
Keywords :
automatic test pattern generation; circuit simulation; error correction codes; error detection codes; fault tolerance; integrated circuit testing; integrated memory circuits; lab-on-a-chip; network-on-chip; radiation hardening (electronics); circuit simulation; control-flow checking; error correction; error detection codes; error mitigation; fault-tolerance; labs-on-chip; laser-based fault injection; memory self-repair; memory self-test; multiport chips; networks-on-chip; on-line testing; parametric testing; radiation hardening; reliability; self-checking circuits; self-test generation techniques; soft error detection;
Conference_Titel :
On-Line Testing Symposium, 2008. IOLTS '08. 14th IEEE International
Conference_Location :
Rhodes
Print_ISBN :
978-0-7695-3264-6
DOI :
10.1109/IOLTS.2008.71
