Title :
A monolithic HEMT regulated self-biased LNA
Author :
Kobayashi, K.W. ; Esfandiari, R. ; Nelson, B. ; Minot, K. ; Jones, W. ; Biendenbender, M. ; Lai, R. ; Tan, K.L. ; Berenz, J.B.
Author_Institution :
Electron. & Technol. Div., TRW Inc., Redondo Beach, CA, USA
Abstract :
This work benchmarks the first demonstration of a monolithic HEMT LNA design which incorporates active regulated self-bias. The HEMT LNA bias current can be maintained to within /spl plusmn/3% variation over a process threshold variation (Vgs) of /spl plusmn/0.5 Volt. The bias circuitry regulates the bias current to within 1.5% over a 100/spl deg/C temperature range. The amplifier has a nominal gain of 10 dB and a noise figure of 2.5 dB over a 1-10 GHz bandwidth. Across several wafers with a threshold voltage spread of 0.5 Volts, the active bias-regulated LNA maintains repeatable gain and noise figure which varies by less than 1 dB and 0.75 dB respectively. This monolithic regulated self-biased LNA demonstration sheds new light on the producibility and reliability of HEMT MMICs and their applications.<>
Keywords :
MMIC; circuit reliability; field effect integrated circuits; microwave amplifiers; 1 to 10 GHz; 10 dB; 2.5 dB; MMICs; active regulated self-bias; bias current; monolithic HEMT LNA design; process threshold variation; producibility; reliability; threshold voltage spread; Circuits; HEMTs; Low-noise amplifiers; MMICs; Noise figure; Regulators; Space technology; Temperature; Threshold voltage; Topology;
Conference_Titel :
Microwave and Millimeter-Wave Monolithic Circuits Symposium, 1994. Digest of Papers., IEEE 1994
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-1418-2
DOI :
10.1109/MCS.1994.332129