Title :
Research on CCD De-Noising Technology
Author :
Wen, Fang ; Li, Tian-Ze
Author_Institution :
Sch. of Electr. & Electron Eng., Shandong Univ. of Technol., Zibo, China
Abstract :
After the charge coupled device (CCD) noise sources is expatiated, the methods of restraining the main CCD noise are analyzed. For the shot noise, the wavelet theory and adaptive theory are combined and the error formula is derived in a sufficient sampling frequency. The working principle of CDS technology and its impact on filtering the CCD reset noise are discussed. The results show that as long as the choice of appropriate sampling time, the reset noise can be restrained furthest.
Keywords :
charge-coupled devices; signal denoising; wavelet transforms; CCD de-noising technology; adaptive theory; adaptive wavelet denoising; charge coupled device noise sources; reset noise; wavelet theory; Charge coupled devices; Dark current; Electrons; Filtering; Frequency; Low-frequency noise; Noise generators; Noise reduction; Signal processing; Signal to noise ratio;
Conference_Titel :
Image and Signal Processing, 2009. CISP '09. 2nd International Congress on
Conference_Location :
Tianjin
Print_ISBN :
978-1-4244-4129-7
Electronic_ISBN :
978-1-4244-4131-0
DOI :
10.1109/CISP.2009.5304489
