DocumentCode :
2166089
Title :
Verification and Analysis of Self-Checking Properties through ATPG
Author :
Hunger, Marc ; Hellebrand, Sybille
Author_Institution :
Paderborn Univ., Paderborn
fYear :
2008
fDate :
7-9 July 2008
Firstpage :
25
Lastpage :
30
Abstract :
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient errors during system operation are no longer restricted to memories but also affect random logic, and a robust design becomes mandatory to ensure a reliable system operation. Self-checking circuits rely on redundancy to detect and compensate errors online. However, during synthesis and optimization self-checking properties can be destroyed. This paper shows how automatic test pattern generation (ATPG) can be used to analyze self-checking properties. As a result the properties are either verified or the fault detection profile provided by ATPG can be used to increase the error detection or fault tolerance capabilities of the design. Experimental data are shown for several self-checking arithmetic circuits.
Keywords :
automatic test pattern generation; integrated circuit design; integrated circuit testing; monolithic integrated circuits; ATPG; automatic test pattern generation; error detection; external disturbances; fault tolerance; optimization self-checking properties; random logic; self-checking arithmetic circuits; self-checking properties; semiconductor technologies; transient errors; Arithmetic; Automatic test pattern generation; Circuit synthesis; Electrical fault detection; Fault detection; Fault tolerance; Logic design; Pattern analysis; Redundancy; Robustness; robustness checking; self-checking circuits; verification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium, 2008. IOLTS '08. 14th IEEE International
Conference_Location :
Rhodes
Print_ISBN :
978-0-7695-3264-6
Type :
conf
DOI :
10.1109/IOLTS.2008.32
Filename :
4567055
Link To Document :
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