DocumentCode :
2166252
Title :
False Error Study of On-line Soft Error Detection Mechanisms
Author :
Reddy, Monika ; Amrutur, Bharadwaj S. ; Parekhji, Rubin A.
Author_Institution :
Dept. of ECE, Indian Inst. of Sci., Bangalore
fYear :
2008
fDate :
7-9 July 2008
Firstpage :
53
Lastpage :
58
Abstract :
With technology scaling, vulnerability to soft errors in random logic is increasing. There is a need for on-line error detection and protection for logic gates even at sea level. The error checker is the key element for an on-line detection mechanism. We compare three different checkers for error detection from the point of view of area, power and false error detection rates. We find that the double sampling checker (used in Razor), is the simplest and most area and power efficient, but suffers from very high false detection rates of 1.15 times the actual error rates. We also find that the alternate approaches of triple sampling and integrate and sample method (I&S) can be designed to have zero false detection rates, but at an increased area, power and implementation complexity. The triple sampling method has about 1.74 times the area and twice the power as compared to the Double Sampling method and also needs a complex clock generation scheme. The I&S method needs about 16% more power with 0.58 times the area as double sampling, but comes with more stringent implementation constraints as it requires detection of small voltage swings.
Keywords :
SPICE; error detection; logic gates; complex clock generation scheme; double sampling checker; false error detection rates; integrate and sample method; logic gates; online error detection; online soft error detection mechanisms; random logic; technology scaling; triple sampling method; Alpha particles; Capacitance; Circuits; Clocks; Instruments; Neutrons; Sampling methods; Semiconductor materials; Testing; Voltage; false error detection; on-line testing; soft errorsoft error detection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium, 2008. IOLTS '08. 14th IEEE International
Conference_Location :
Rhodes
Print_ISBN :
978-0-7695-3264-6
Type :
conf
DOI :
10.1109/IOLTS.2008.29
Filename :
4567062
Link To Document :
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