DocumentCode
2166252
Title
False Error Study of On-line Soft Error Detection Mechanisms
Author
Reddy, Monika ; Amrutur, Bharadwaj S. ; Parekhji, Rubin A.
Author_Institution
Dept. of ECE, Indian Inst. of Sci., Bangalore
fYear
2008
fDate
7-9 July 2008
Firstpage
53
Lastpage
58
Abstract
With technology scaling, vulnerability to soft errors in random logic is increasing. There is a need for on-line error detection and protection for logic gates even at sea level. The error checker is the key element for an on-line detection mechanism. We compare three different checkers for error detection from the point of view of area, power and false error detection rates. We find that the double sampling checker (used in Razor), is the simplest and most area and power efficient, but suffers from very high false detection rates of 1.15 times the actual error rates. We also find that the alternate approaches of triple sampling and integrate and sample method (I&S) can be designed to have zero false detection rates, but at an increased area, power and implementation complexity. The triple sampling method has about 1.74 times the area and twice the power as compared to the Double Sampling method and also needs a complex clock generation scheme. The I&S method needs about 16% more power with 0.58 times the area as double sampling, but comes with more stringent implementation constraints as it requires detection of small voltage swings.
Keywords
SPICE; error detection; logic gates; complex clock generation scheme; double sampling checker; false error detection rates; integrate and sample method; logic gates; online error detection; online soft error detection mechanisms; random logic; technology scaling; triple sampling method; Alpha particles; Capacitance; Circuits; Clocks; Instruments; Neutrons; Sampling methods; Semiconductor materials; Testing; Voltage; false error detection; on-line testing; soft errorsoft error detection;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2008. IOLTS '08. 14th IEEE International
Conference_Location
Rhodes
Print_ISBN
978-0-7695-3264-6
Type
conf
DOI
10.1109/IOLTS.2008.29
Filename
4567062
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