DocumentCode :
2166294
Title :
Volume testing of commercial RFICs
Author :
Wilson, T.
Author_Institution :
TriQuint Semicond. Inc., Beaverton, OR, USA
fYear :
1994
fDate :
22-25 May 1994
Firstpage :
47
Lastpage :
50
Abstract :
Unlike the military world from which the previous generation of RFICs came, price is everything in today´s commercial arena. The strategies and equipment used to accomplish this task must be focused on this bottom line. Following this line of thought, the increased integration now available in today´s RFICs, requires that the testing be focused on the product´s functionality rather than the subcircuit´s (single function) parametrics. This strategy improves throughput, reduces cost, and most importantly guarantees that the end product meets the customer´s application requirements.<>
Keywords :
MMIC; automatic testing; hybrid integrated circuits; integrated circuit testing; microwave integrated circuits; monolithic integrated circuits; production testing; RF ICs; UHF IC; commercial RFICs; volume testing; Acoustical engineering; Application software; Automatic testing; Circuit testing; Costs; Hardware; Instruments; Radiofrequency integrated circuits; System testing; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Millimeter-Wave Monolithic Circuits Symposium, 1994. Digest of Papers., IEEE 1994
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-1418-2
Type :
conf
DOI :
10.1109/MCS.1994.332145
Filename :
332145
Link To Document :
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