Title :
A Systematical Method of Quantifying SEU FIT
Author :
Wen, Shi-Jie ; Alexandrescu, Dan ; Perez, Renaud
Author_Institution :
Cisco Syst., Inc., San Jose, CA
Abstract :
We present a practical, systematical method for the evaluation of the soft error rate (SER) of microelectronic devices. Existing methodologies, practices and tools are integrated in a common approach while highlighting the need for specific data or tools. The showcased method is particularly adapted for evaluating the SER of very complex microelectronic devices by engineers confronted to increasingly demanding reliability requirements.
Keywords :
radiation hardening (electronics); reliability; SEU fit; microelectronic devices; radiation hardening; reliability requirements; soft error rate; Circuits; Error analysis; Error correction; Manufacturing; Microelectronics; Performance analysis; Performance evaluation; Reliability engineering; Single event upset; System testing; FIT; Single Event; Single Event Transient; Single Event Upset; Soft Error; Soft Error Rate;
Conference_Titel :
On-Line Testing Symposium, 2008. IOLTS '08. 14th IEEE International
Conference_Location :
Rhodes
Print_ISBN :
978-0-7695-3264-6
DOI :
10.1109/IOLTS.2008.62
