DocumentCode
2166449
Title
A Systematical Method of Quantifying SEU FIT
Author
Wen, Shi-Jie ; Alexandrescu, Dan ; Perez, Renaud
Author_Institution
Cisco Syst., Inc., San Jose, CA
fYear
2008
fDate
7-9 July 2008
Firstpage
109
Lastpage
114
Abstract
We present a practical, systematical method for the evaluation of the soft error rate (SER) of microelectronic devices. Existing methodologies, practices and tools are integrated in a common approach while highlighting the need for specific data or tools. The showcased method is particularly adapted for evaluating the SER of very complex microelectronic devices by engineers confronted to increasingly demanding reliability requirements.
Keywords
radiation hardening (electronics); reliability; SEU fit; microelectronic devices; radiation hardening; reliability requirements; soft error rate; Circuits; Error analysis; Error correction; Manufacturing; Microelectronics; Performance analysis; Performance evaluation; Reliability engineering; Single event upset; System testing; FIT; Single Event; Single Event Transient; Single Event Upset; Soft Error; Soft Error Rate;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2008. IOLTS '08. 14th IEEE International
Conference_Location
Rhodes
Print_ISBN
978-0-7695-3264-6
Type
conf
DOI
10.1109/IOLTS.2008.62
Filename
4567071
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