DocumentCode :
2166459
Title :
The evolution of DRAM technology towards WSI
Author :
Warren, Ken ; Sinclair, Alan
fYear :
1991
fDate :
29-31 Jan 1991
Firstpage :
243
Lastpage :
247
Abstract :
Issues connected with the evolution of dynamic random-access memory (DRAM) technology towards wafer scale integration (WSI) are examined. It is pointed out that as one moves towards submicron technologies, fundamental physical, electrical, and processing limits are being encountered, and it is becoming clear that this trend cannot continue. This phenomenon is most clearly demonstrated by the development of DRAM technology. The costs to develop new fabrication lines are escalating to levels that require funding investments approaching national rather that corporate budgets. It is concluded that it is these factors which make WSI and related high-density interconnect technologies an inevitability if demands for higher levels of circuit integration are to continue to be satisfied into the nineties and beyond
Keywords :
DRAM chips; VLSI; integrated circuit technology; technological forecasting; DRAM technology; WSI; costs; dynamic random-access memory; electrical limits; fundamental physical limits; funding investments; high-density interconnect technologies; processing limits; submicron technologies; wafer scale integration; Costs; Fabrication; Geometry; Integrated circuit interconnections; Investments; Lead compounds; Random access memory; Semiconductor devices; Silicon; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9126-3
Type :
conf
DOI :
10.1109/ICWSI.1991.151721
Filename :
151721
Link To Document :
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