Using Low Pass Filters in Mitigation Techniques against Single-Event Transients in 45nm Technology LSIs

In this paper, we investigate optimum radiation hardened by design (RHBD) for use against single-event transients (SET) using low-pass filters (LPF) including RHBD techniques against single-event upsets (SEU) for sequential logic in 45 -nm technology in a terrestrial environment. Three types of LPF were investigated regarding their SET pulse immunities, area penalties, and performance penalties. We proposed a flip-flop of SET-SEU-RHBD. This flip-flop has LPF using a C-element with dual transmission and applies an MNL technique only on the master latch. This flip-flop is designed with 45-nm technology and a 16-grid height. Mitigation efficiencies of the flip-flop are estimated by accelerated experiments and simulations. The flip-flop can protect 90% of SEU and 52 ps SET pulse with low penalties.