Title :
Simulation of PIN diode under electromagnetic pulse based on decision tree
Author :
Xiang, Kai ; Du, Zhengwei
Author_Institution :
Dept. of Electron. Eng., Tsinghua Univ., Beijing
Abstract :
The electromagnetic pulse probably disturbs the normal operation of the PIN diode temporarily, or even damages the PIN diode permanently. Unlike just studying a certain aspect on the impact of the PIN diode in the other papers, the approach of decision trees is adopted to reveal the relationship between the extent of the PIN diode damage and the parameters (the rise time, width, and voltage) of electromagnetic pulse in an all-round manner. Besides, using decision tree to classify the degree of the PIN diode damage can save simulation time.
Keywords :
decision trees; electromagnetic pulse; p-i-n diodes; PIN diode; decision tree; electromagnetic pulse; rise time; voltage; Charge carrier processes; Decision trees; EMP radiation effects; Electromagnetic transients; Electronic equipment; Numerical models; Poisson equations; Temperature; Thermal conductivity; Voltage;
Conference_Titel :
Antennas, Propagation and EM Theory, 2008. ISAPE 2008. 8th International Symposium on
Conference_Location :
Kunming
Print_ISBN :
978-1-4244-2192-3
Electronic_ISBN :
978-1-4244-2193-0
DOI :
10.1109/ISAPE.2008.4735500
