• DocumentCode
    2166849
  • Title

    A 16-24 GHz CMOS SOI LNA with 2.2 dB Mean Noise Figure

  • Author

    Kanar, Tumay ; Rebeiz, Gabriel M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, La Jolla, CA, USA
  • fYear
    2013
  • fDate
    13-16 Oct. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a K-band low-noise amplifier (LNA) with a measured mean noise figure of 2.2 dB at 16-24 GHz. The LNA is fabricated in 45 nm Semiconductor-on-Insulator (SOI) CMOS process. The measured S-parameters result a peak gain of 19.5 dB at 20 GHz and S11 <; -10 dB at 16-24 GHz. The design shows that CMOS SOI process can provide a comparable noise performance with GaAs and SiGe devices. To the best of authors´ knowledge, this LNA achieves the lowest noise figure at K-band in any CMOS process.
  • Keywords
    CMOS analogue integrated circuits; S-parameters; low noise amplifiers; semiconductor-insulator boundaries; K-band low-noise amplifier; S-parameter; SOI CMOS process; frequency 16 GHz to 24 GHz; frequency 20 GHz; gain 19.5 dB; mean noise figure; noise figure 2.2 dB; semiconductor-on-insulator; size 45 nm; CMOS integrated circuits; CMOS technology; Gain; Noise; Noise measurement; Silicon germanium; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductor Integrated Circuit Symposium (CSICS), 2013 IEEE
  • Conference_Location
    Monterey, CA
  • Type

    conf

  • DOI
    10.1109/CSICS.2013.6659186
  • Filename
    6659186