DocumentCode :
2167027
Title :
Special Session 4: Reliability and Circuit Simulation
Author :
Aitken, Rob
fYear :
2008
fDate :
7-9 July 2008
Firstpage :
195
Lastpage :
196
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium, 2008. IOLTS '08. 14th IEEE International
Conference_Location :
Rhodes, Greece
Print_ISBN :
978-0-7695-3264-6
Type :
conf
DOI :
10.1109/IOLTS.2008.69
Filename :
4567093
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2167027
