DocumentCode :
2167096
Title :
Reliability in Application Specific Mesh-Based NoC Architectures
Author :
Refan, Fatemeh ; Alemzadeh, Homa ; Safari, Saeed ; Prinetto, Paolo ; Navabi, Zainalabedin
Author_Institution :
Dept. of Electr. & Comput. Eng. Sch. of Eng., Tehran Univ., Tehran
fYear :
2008
fDate :
7-9 July 2008
Firstpage :
207
Lastpage :
212
Abstract :
Networks on chips (NoCs) provide a mechanism for handling complex communications in the next generation of integrated circuits. At the same time, lower yield in nano-technology, makes self repair communication channels a necessity in design of digital systems. This paper proposes a reliable NoC architecture based on specific application mapped onto an NoC. This architecture is capable of recovering from permanent switch failures via replacing them by neighboring switches. This method has hardware and power consumption overhead, but significantly improves reliability and has a very little effect on the performance of the system. We suggest a reliability analysis method based on the combinatorial reliability models and use it to evaluate our proposed fault-tolerant NoC architecture.
Keywords :
integrated circuit reliability; nanoelectronics; network-on-chip; application specific mesh-based NoC architectures; combinatorial reliability models; integrated circuits; nanotechnology; networks on chips reliability; permanent switch failures; power consumption overhead; reliability analysis method; self repair communication channels; Communication channels; Communication switching; Digital systems; Integrated circuit reliability; Integrated circuit yield; Network-on-a-chip; Next generation networking; Power system reliability; Switches; Telecommunication network reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium, 2008. IOLTS '08. 14th IEEE International
Conference_Location :
Rhodes
Print_ISBN :
978-0-7695-3264-6
Type :
conf
DOI :
10.1109/IOLTS.2008.53
Filename :
4567096
Link To Document :
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